The basic function of the Rammaster Compact is to perform a full speed functional test on DRAMs, SRAMs, SIMMs and SIPs using a variety of test algorithms to ensure reliable and rapid results. The test is performed by reconfigurable HARDWARE, allowing most memories to be tested at their theoretical full speed. Any malfunctioning memory cell results in a FAIL indication, and in the case of SIMM and SIP modules the faulty bit(s) is/are identified on the integral LCD display so that the module can be repaired. Additional facilities are also provided, amongst them test loops that can be used for goods inwards inspection or detecting intermittent faults. The supply voltage to the IC under test can be varied by ±5% during the test to simulate actual circuit conditions. Since the Rammaster Compact contains an extensive memory IC library, it is not necessary to programme the unit other than to select the IC part type. The unit is equipped with sockets covering the majority of Dual in Line (DIL), SIMM and SIP packages, and a range of adaptors are available for SOJ and ZIP packages and also for 72 pin PS/2 type SIMM modules. The RamMaster is capable of being upgraded and is designed to test the components of tomorrow.