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HZ65-3
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- Test of semiconductors
- Test of discrete components
- Rugged and compact
In conjunction with an oscilloscope, the
component tester HZ65 can be used to test
semiconductor components, resistors,
capacitors and inductors not only out-of-
circuit, but also often without desoldering
them from circuit boards. Within certain
limits, testing of integrated circuitry is also
possible. Transistors can be plugged into
two 3-point sockets; any combination of 2
contacts may be selected for testing.
This simplifies testing of different internal
transistor paths (base-emitter, emitter-
collector, base-collector). Components with
larger-diameter leads and ICs are connected
to the 2 jacks on the side of the HZ65 using
2 test cables. The direction of current flow
through the tested component or IC can be
reversed. The HZ65 is particularly indi-
spensable for repairs of electronic devices,
providing good-bad information within
seconds. This also allows quick comparison
of the unit under test with a known good
component or network.
Bedienungsanleitung
Dokumenttyp:
Bedienungsanleitung
Seitenanzahl:
10
Größe:
193,9 KB
Sprache:
Englisch, Deutsch
Revision:
Dokument-ID:
27-0065-0310
Datum:
Qualität:
Elektronisches Dokument, kein Scan, sehr gut lesbar.
Upload Datum:
22. Dezember 2018
MD5:
a44c0ece-05df-0319-944b-162f8cdedb47
Uploader:
Herbert Vögele
Downloads:
475