The Hewlet t-Packard Model 4145A Semiconductor Parameter Analyzer is a fully automatic, high performance, programmable test instrument designed to measure, analyze, and graphically display the DC characteristics of a wide range of semiconductor devices, such as diodes, bipolar transistors, field-effect transistors, wafers, ICs, etc. Main applications include computer-aided design (CAD) of ICs, new device evaluation, materials evaluation, component selection for circuit design, incoming/outgoing inspection, semiconductor process control, quality control, and quality assurance. It is equipped with four programmable stimulus/measurement units (SMU), two programmable Voltage Source units (Vs), two voltage monitor units (Vm), a fully interactive graphics display, removable flexible-disc storage, softkeys, full arithmetic keyboard, and HP-IB. And it can be used on the bench or as part of a complete measurement system in the laboratory or on the production line.