1 INTRODUCTION AND SPECIFICATIONS TT. INTRODUCTION... 1-1 1-2. SPECIFICATIONS... 1-2 1-3. SAFETY CONSIDERATIONS... 1-4 1-4. LIST OF Accessories 1-4 Section 2 OPERATING INSTRUCTIONS IT. INTRODUCTION... 2-1 2-2. UNPACKING YOUR INSTRUMENT... 2-1 2-3. GENERAL OPERATION... 2-1 2-4. FUSE REPLACEMENT... 2-2 2-5. PHYSICAL FEATURES... 2-2 2-6. Front Panel... 2-2 2-7. Back Panel... 2-4 2-8. CRT Display... 2-4 2-9. OPERATION... 2-5 2-10. INITIAL SETUP... 2-6 2-11. Range Selection... 2-6 2-12. Channel Selection... 2-6 2-13. Frequency Selection... 2-8 2-14. Pulse Generator 2-8 2-15 Huntron Instruments SWITCHER 410 CONNECTIONS... 2-10 2-16. TRACKER TRAINING... 2-11 2-17. EXTERNAL CLEANING AND LUBRICATION... 2-11 2-18. STORAGE INSTRUCTIONS... 2-11 Section 3 THEORY OF OPERATION IT INTRODUCTION... 3-1 3-2. FUNCTIONAL OVERVIEW... 3-1 3-3. Control Logic... 3-2 3-4 Oscillator 3-3 3-5. Signal Section... 3-4 3-6. Pulse Generator 3-5 3-7. CRT Display... 3-7 3-8. Power Supply... 3-7 3-9. VOLTAGE AND POWER CONSIDERATIONS... 3-7 3-10. Power in a Resistor... 3-8 3-11. Power in a Diode... 3-9 3-12. Power in a Zener Diode... 3-10 4 MAINTENANCE TT. INTRODUCTION... 4-1 4-2. SERVICE INFORMATION... 4-1 4-3. CMOS HANDLING PROCEDURES... 4-1 4-4. DISASSEMBLY PROCEDURE... 4-2 4-5. REASSEMBLY PROCEDURE... 4-9 4-6. PERFORMANCE TESTS... 4-11 4-7. INTERNAL ADJUSTMENTS... 4-14 4-8. TROUBLESHOOTING... 4-18 Section 5 LIST OF REPLACEABLE PARTS TT INTRODUCTION... 5-1 5-2. HOW TO OBTAIN PARTS... 5-1 Section 6 SCHEMATIC DIAGRAMS ■£T SCHEMATICS... 6-1 Section 7 RESISTORS, CAPACITORS AND INDUCTORS TT. TESTING RESISTORS... 7-1 7-2. Low Range... 7-1 7-3. Medium 1 Range... 7-1 7-4. Medium 2 Range... 7-2 7-5. High Range... 7-3 7-6. TESTING CAPACITORS... 7-3 7-7. TESTING INDUCTORS... 7-5 7-8. TESTING FERRITE INDUCTORS... 7-7 Section 8 TESTING DIODES &T THE SEMICONDUCTOR DIODE AND ITS CHARACTERISTICS... 8-1 8-2. Diode Symbol and Definition... 8-1 8-3. The Volt-Ampere Characteristic... 8-2 8-4. SILICON DIODES... 8-2 8-5. Signatures of a Good Diode... 8-2 8-6. Signatures of Defective Diodes... 8-3 8-7. Signatures of a High Voltage Diode... 8-7 8-8. RECTIFIER BRIDGES... 8-8 8-9. LIGHT EMITTING DIODES... 8-10 8-10. ZENER DIODES... 8-10 9T BIPOLAR JUNCTION TRANSISTORS... 9-1 9-2. An Important Note About Testing Transistors... 9-2 9-3. NPN BIPOLAR TRANSISTORS... 9-2 9-4. B-E Junction... 9-3 9-5. C-B Junction... 9-3 9-6. C-E Connection... 9-3 9-7. PNP BIPOLAR TRANSISTORS... 9-5 9-8. B-E Junction... 9-5 9-9. C-B Junction... 9-6 9-10. C-E Connection... 9-7 9-11. POWER TRANSISTORS-NPN AND PNP... 9-8 9-12. DARLINGTON TRANSISTORS... 9-8 9-13. Comparing B-E Junctions... 9-9 9-14. Comparing C-E Connections... 9-11 9-15. Comparing C-B Junctions... 9-13 9-16. JUNCTION FIELD EFFECT TRANSISTORS... 9-13 9-17. Gate-Source Connection... 9-14 9-18. Drain-Gate Connection... ... 9-15 9-19. Drain-Source Connection... 9-16 9-20. MOS FIELD EFFECT TRANSISTORS... 9-16 9-21. MOSFET WITH PROTECTION DIODE... 9-17 9-22. Gate-Source Connection... 9-18 9-23. Drain-Gate Connection... 9-19 9-24. Drain-Source Connection... 9-20 9-25. MOSFET WITHOUT A PROTECTION DIODE... 9-21 Section 10 USING THE PULSE Generator 10-1. INTRODUCTION... 10-1 10-2. SILICON CONTROLLED RECTIFIERS (SCR)... ... 10-1 10-3. TRIAC DEVICES... 10-5 10-4. TRANSISTORS... 10-7 10-5. OPTOCOUPLERS... 10-10 10-6. Transistor Optocoupler... 10-11 10-7. Darlington Transistor Optocoupler... 10-15 10-8. SCR Optocoupler... 10-19 10-9. Triac Optocoupler... 10-23 10-10. Photocell Optocoupler... 10-26 11 TESTING MULTIPLE COMPONENT CIRCUITS 11-1 2000 DIAGNOSTIC PRINCIPLES... 11-1 11-2. DIODE/RESISTOR CIRCUITS... 11-1 11-3. Diode In Parallel With A Resistor... 11-1 11-4. Diode In Series With A Resistor... 11-4 11-5. DIODE AND CAPACITOR PARALLEL COMBINATION... 11-6 11-6. RESISTOR AND CAPACITOR PARALLEL COMBINATION... 11-10 11-7. INDUCTOR AND DIODE PARALLEL COMBINATION... 11-11 Section 12 TESTING INTEGRATED CIRCUITS 12-1. INTRODUCTION... 12-1 12-2. Integrated Circuit Technology... 12-1 12-3. Integrated Circuit Testing Techniques... 12-2 12-4. LINEAR OPERATIONAL Amplifier 12-3 12-5. LINEAR VOLTAGE REGULATORS... ... 12-8 12-6. The 7805 Regulator... 12-8 12-7. The 7905 Regulator... 12-11 12-8. 555 TIMERS... 12-14 12-9. TTL DIGITAL INTEGRATED CIRCUITS... 12-20 12-10. General... 12-20 12-11. TTL Devices With Totem Pole Output... 12-21 12-12. LS TTL Devices... 12-24 12-13. Tri-State LS TTL Devices... 12-25 12-14. CMOS INTEGRATED CIRCUITS... 12-28 12-15. Quad NAND Gate... 12-29 12-16. Analog Switch... 12-30 12-17. MOS STATIC RAM... 12-33 12-18. EPROM... 12-36 12-19. BIPOLAR PROM... 12-40 12-20. DIGITAL TO ANALOG Converter 12-43 12-21. MICROPROCESSORS... 12-47 Section 13 TESTING COMPONENTS BY COMPARISON 13-1. INTRODUCTION...13-1 13-2. SETUP PROCEDURES...13-1 13-3. POWER TRANSISTORS MJE240...13-2 13-4. MJE240 B-E Junction...13-2 13-5. MJE240 C-E Connection...13-4 13-6. HIGH VOLTAGE DIODE HV15F...13-6 13-7. 100nF 25V ELECTROLYTIC CAPACITOR...13-7 14 SOLVING BUS PROBLEMS 14-1. INTRODUCTION...14-1 14-2. STUCK WIRED-OR BUS...14-1 14-3. UNSTUCK WIRED-OR BUS...14-1 14-4. MEMORIES...14-1 Section 15 TROUBLESHOOTING TIPS 15-1. TIPS ON USING YOUR 2000 15-1 Appendices Appendix A Huntron Instruments TRACKER CMOS TEST...A-l Appendix B Huntron Instruments TRACKER TTL AND CMOS TESTS...B-l