• 100 Measurement Points with Full 1 GHz Bandwidth • 1000 Dots Digital Waveform Storage on Both Inputs (Waveform Recording) • Autoscan™: Automatic Search for the Signal of Interest • IEEE-488 Interface Standard • Microprocessor-Controlled Waveform Analyzer For applications calling for the automated test and characterization of multi-pin. high speed semiconductor devicesor assemblies. Wavetek recommends the Model 3000 Waveform Analyzer When configured with Model 3020 Probe Multiplexers. Model 3000 can form up tns 10(1 rhanm'l 1 Γ.Η7 handwidlh digital readout sampling oscilloscope, which is unrivalled in its ability to meet the test requirements of the latest generation of high speed devices and assemblies. The innovative design of the Waveform Analyzer. Probes and Multiplexers allows a unique combination of measurement speed, resolution and accuracy, to give unequalled system throughput, repeatability and dependability. Flexible control of this performance—both on the bench and via the IEEE-488 interface — allows automated determination of parameters such as transition times, propagation delays, pulse widths, overshcot, undershoot and other pulse aberrations, as well as voltage levels. Furthermore. the modularity of design and construction enables easy expansion and upgrade as and when future test requirements dictate.