The instrument is a high-speed, precision sampling system that finds use in: - high-performance semiconductor/computer applications, such as semiconductor testing, TDR characterization of circuit boards, IC packages and cables, and high-speed serial digital data communications. - high-performance communications applications, such as design evaluation and manufacturing test of datacom and telecom components, transceiver subassemblies, and transmission systems. The instrument includes a user interface that runs on the Microsoft Windows 98 operating system as a windowed application. You operate the instrument using front-panel Controls with the mouse and keyboard or with the touch screen. Key features include: industry-leading waveform acquisition rate, with Sample, Envelope, and Average acquisition modes. support for up to six sampling modules for a maximum configuration of ten inputs. (Up to eight inputs can be active at a time. See Maximum Configuration on page 1–10). full programmability, with an extensive GPIB-command set and a messagebased interface. true differential TDR, with fast step (35 psec reflected risetime) when used with a TDR-capable sampling module. negligible long-term jitter degradation (<0.1 ppm), which substantially improves the ability to view signals that are far delayed from the trigger point without distortion. industry-leading trigger bandwidth (12+ GHz) when using the built-in-pres-caler. support of both telecom (SONET and SDH) and datacom (Fibre Channel and Gigabit Ethernet) optical communication standards. powerful built-in measurement capability, including histograms, mask testing, and automatic measurements. Automatic measurements include eye/communications measurements, such as Q factor, extinction ratio, and optical power and general-purpose measurements, such as jitter and noise. DC to 50 GHz optical bandwidth; DC to 50 GHz electrical bandwidth, with up to 12.5 GHz triggering. FrameScan acquisition for isolating data-dependent failures during conformance/performance testing and for examining very low-level repetitive signals. support for optical conformance testing of SONET/SDH signals from 622 Mbps to 10.66 Gbps and for Fibre Channel 1063 and Gigabit Ethernet signals. a large 10-inch color display that supports color grading of waveform data to show sample density. an intuitive UI (User Interface), with built-in online help displayable on screen.