Hameg - HZ65-3 - Probe
Manufacturer:
Equipment:
HZ65-3
Date:
Category:
Group:
Sub Group:
Information
- Test of semiconductors
- Test of discrete components
- Rugged and compact
In conjunction with an oscilloscope, the
component tester HZ65 can be used to test
semiconductor components, resistors,
capacitors and inductors not only out-of-
circuit, but also often without desoldering
them from circuit boards. Within certain
limits, testing of integrated circuitry is also
possible. Transistors can be plugged into
two 3-point sockets; any combination of 2
contacts may be selected for testing.
This simplifies testing of different internal
transistor paths (base-emitter, emitter-
collector, base-collector). Components with
larger-diameter leads and ICs are connected
to the 2 jacks on the side of the HZ65 using
2 test cables. The direction of current flow
through the tested component or IC can be
reversed. The HZ65 is particularly indi-
spensable for repairs of electronic devices,
providing good-bad information within
seconds. This also allows quick comparison
of the unit under test with a known good
component or network.
User manual
Manual type:
User manual
Pages:
10
Size:
193.9 KB
Language:
english, german
Revision:
Manual-ID:
27-0065-0310
Date:
Quality:
Electronic document, no scan, very well readable.
Upload date:
Dec. 22, 2018
MD5:
a44c0ece-05df-0319-944b-162f8cdedb47
Uploader:
Herbert Vögele
Downloads:
475