A.B.I. Electronics - Rammaster Compact - Other
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Equipment:
Rammaster Compact
Date:
1993
Category:
Group:
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Information
The basic function of the RamMaster Compact is to perform
a full speed functional test on DRAMs, SRAMs, SIMMs and
SIPs using a variety of test algorithms to ensure reliable
and rapid results. The test is performed by reconfigurable
HARDWARE, allowing most memories to be tested at their
theoretical full speed. Any malfunctioning memory cell
results in a FAIL indication, and in the case of SIMM and
SIP modules the faulty bit(s) is/are identified on the
integral LCD display so that the module can be repaired.
Additional facilities are also provided, amongst them
test loops that can be used for goods inwards inspection
or detecting intermittent faults. The supply voltage
to the IC under test can be varied by ±5% during the
test to simulate actual circuit conditions. Since the
RamMaster Compact contains an extensive memory IC library,
it is not necessary to programme the unit other than
to select the IC part type. The unit is equipped with
sockets covering the majority of Dual in Line (DIL),
SIMM and SIP packages, and a range of adaptors are
available for SOJ and ZIP packages and also for 72 pin
PS/2 type SIMM modules. The RamMaster is capable of being
upgraded and is designed to test the components of
tomorrow.
User manual
Manual type:
User manual
Pages:
14
Size:
5.3 MB
Language:
english
Revision:
Manual-ID:
Date:
Quality:
Scanned document, all readable.
Upload date:
March 16, 2013
MD5:
c32fb4be-cb3a-75d2-e613-4f42e948fa90
Downloads:
730