The 2310 Communication Analyzer is the perfect telecommunications installation and maintenance too! for mobile workforce. A hand-held tester, its ease-of-use, flexibility, and functionality have established it as the next generation in test instruments. The 2310 is the smallest OC-48, battery-powered, integrated tester available. As a member of the 2000 Test Pad family of products, it combines a graphical user Interface with a touch-sensitive screen to simplify test setup and reduce test configuration time. The “smart tester/' icon-driven Interface is easy to learn, and the large display screen provides ample space for displaying test results. Figure 1 shows the 2310, Even though the 2310 weighs only 5 pounds, it provides integrated test capabilities: 0 DS1, DS3, and SONET interfaces # Standard Dual Receive for DS1 * Dual Receive for DS3, and STS-1 (optional) # OC-3, 0012, and OC-48 interfaces (optional) « DSO, DS1, Muxed DS3, and VT1.5 in SONET testing « Controls and Results Print capability « Monitor/Thru and Terminate applications for DS 1, DS3, STS-1, OC-3/OC-12/OC-48 interfaces • DS 1, DS3, and SONET (OC-3/3c, OC-12/12c, OC-48/48c) BERT patterns # DS 1 Unframed, D4, ESF and SLC 96 framing, T1 BERT, VF tone testing, and insertion of frame, BPVs, and logic errors # DS3 Unframed, M13, C-bit BERT or Muxed DS3 testing, internal or recovered timing, RX/TX at HIGH, DSX, and LOW levels, insertion of frame, BPVs, and logic errors, as well as, FEBE and yellow alarm emulation • SONET SPE Payloads (Async DS 1 mapping, DS3 mapping, full SPE BERT), SPE pointer manipulation, K-byte manipulation, STS-1 RX/TX at HIGH, DSX, and LOW levels, insertion of Line and Path AIS alarms, FEBE, LOP, and BIP errors, as well as frame, logic, and BPV (STS-1 only) errors, and TX/RX path trace for viewing • On-Line Help The touch-screen user Interface enables these test capabilities in an easy, step-by-step manner: 0 Primary Rate ISDN analysis: part number TB2310-PRI This option adds Primary Rate ISDN testing capabilities for DS 1, DS3, and STS-1. It enables the ability to place and receive multiple voice/data calls, perform D channel backup, support NFAS, and monitor the circuit via D channel decodes. It also supports AT&T 5ESS, NT DMS100 and NI-2 call controls, as well as, supports multiple call types such as voice, 56K, 64K, Nx64, Nx56, and HO. » GR-303 analysis: part number TB2310-GR303 This option includes the ability to verify the connectivity of the TMC/ CSC and EOC management channels. It also verifies report-call setup and teardown information. 9 Advanced stress patterns: part number TB2310-ASP This option adds the ability to transmit and receive fixed, long patterns beyond the standard patterns offered in the test set. The seven T1 stress patterns that are added to the 2310 are designed to stress test the timing recovery circuits and span-line repeater ALBO circuitry. The seven patterns include: Tl-DALY, 55 octet, 2-96, 3-54, 4-120, 5-53, and MIN/MAX. « Fractional T1 analysis: part number TB2310-FT1 This option provides fractional T1 modes for contiguous and noncontiguous, 56KxN and 64KxN, andFTl testing capabilities. This option enables complete qualification and testing of new FT1 circuits before connecting customer premises equipment. The V.54 FT1 loop code is also added to the features list and allows for singleset testing of FT1 circuits from a convenient Tl, DS3 or STS-1 access point. DDS Analysis: part number TB231.0-DDS This option provides T1 DDS modes for 56K and 64K DDS circuits. It enables complete qualification and testing of new DDS circuits using the DDS1-6, 63, 511 and 2047 stress patterns. The OCU, DSO-DP, CSU, and Channel loop codes allow for single-set testing of DDS circuits from a convenient T1 access point. • Signaling Analysis: part number TB2310-SIG This option enables you to test the ability of a switch/PBX to handle incoming calls and allows you to emulate switch-to-switch communications. You can place, receive and monitor calls over several trunk types. Features include the ability to send and receive DTMF/MF/DP digits to and from switches and PBXs, as well as the ability to measure inter-digit delay and digit/tone duration. * VF PCM TIMS Analysis: part number TB2310-VF This option enables the 2310 to perform a frequency sweep test to qualify VF circuits. Features such as noise measurements including SNR, C-Message, C~Notch, 3k-Flat, and 3k-Notch are also part of this option. Voice Drop, variable tone, level insertion, and level frequency results are standard with the 2310, * VT100 Emulation: part number TB2310-VT100 This option enables the 2310 to emulate a VT100 terminal. The option includes an RS-232 interconnect cable. # Intelligent Line Equipment Analysis: part number TB2310-ILE This option provides the ability to loop up and loop down individual T1 addressable office repeaters, line repeaters, and to transmit maintenance switch commands. Additionally, you can loop up and loop down HDSL line units, doublers, and remote units. Supported T1 equipment include units by Teltrend, Westell, and XEL. Supported HDSL equipment include units by Adtran and PairGain. - OC-3c and 0C-12c ATM Analysis: part numbers TB2310-ATM-OC3 and TB2310-ATM-OC12 This option provides OC-3c and OC-12c ATM test functionality for the 2310, This option enables the 2310 to transmit and receive ATM cell streams with different VPI/VCI addresses, measure ATM QoS parameters like dropped cells, mis-inserted cells, and out-of-sequence cells. It automatically identifies multiple cell streams on an ATM circuit, allowing complete qualification and testing of new ATM circuits before connecting customer premises equipment and/or Network Elements.