B & K Manufacturing Company - 501A - Analyzer
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B & K Manufacturing Company 501A
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Equipment:
501A
Date:
1972
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Information
The semiconductor curve tracer displays a family of dynamic
characteristic curves for transistors, FET's, diodes, Zener
diodes, triacs, tunnel diodes and all other semiconductor
devices on the screen of an oscilloscope. Most authorities
agree that a dynamic curve tracer is the best instrument for
testing semiconductors, since it simulates actual operating
conditions of changing voltage and current. Some of the
characterististics which may be measured are gain (beta),
leakage, breakdown voltage, output admittance, linearity,
effects of capacitance and effects of temperature.
When first introduced, semiconductor curve tracers were
primarily employed in engineering laboratories to select
transistors with specific characteristics for design
applications. Later the instruments became widely used for
sorting, inspecting and testing semiconductors in production
assembly and by technicians for troubleshooting. The latest
application has been the discovery that curve tracers can be
used for troubleshooting without removing the semi-
conductor from the circuit. In addition, a semiconductor
curve tracer offers several other servicing advantages. By
matching characteristics, balanced and/or complementary
pairs may be selected. Matching also allows sorting and
selection of transistors for substitution, resulting in an
inventory reduction of replacement parts.
An oscilloscope must be used in conjunction with the curve
tracer for the display. Almost any 3-inch or larger general
purpose oscilloscope is satisfactory as long as it has
external horizontal facilities, and is DC coupled. The B & K
Models 1440, 1460 and 1465 Oscilloscopes are ideal
companions for the Model 501A Curve Tracer. A graticule
overlay for the oscilloscope screen and built-in calibration
signals from the curve tracer makes the unit complete.
The special 3-tip probe supplied with the unit simplifies
in-circuit testing by contacting base, collector and emitter
simultaneously with a single probe. This is very convenient
for testing transistors mounted on circuit boards.
2 Manuals
Service and user manual
Manual type:
Service and user manual
Pages:
40
Size:
16.7 MB
Language:
english
Revision:
Manual-ID:
Date:
January 1972
Quality:
Scanned document, all readable.
Upload date:
Aug. 5, 2018
MD5:
ee8908b2-1883-1db9-a3cf-07e8862b52e6
Downloads:
410
Service and user manual
Manual type:
Service and user manual
Pages:
40
Size:
16.7 MB
Language:
english
Revision:
Manual-ID:
Date:
January 1972
Quality:
Scanned document, all readable.
Upload date:
Aug. 6, 2018
MD5:
4d7e82e8-c642-667d-82eb-86eea1e0e7b3
Downloads:
403