Model 251 I-V Test Software is a program that controls a system of instruments designed to measure I-V characteristics of semiconductors. Model 251 can be configured to support the following instruments: • Model 236/237/238 Source Measure Units • Model 2361 Trigger Controller • Model 213 Quad Voltage Source • Model 707 Switching Matrix Other Keithley and non-Keithley instruments are supported with user-programmed device-dependent commands. Key Model 251 features include: • The menu-driven software allows easy data collection of parameters from semiconductors and other components. No computer programming knowledge is necessary to operate the system. • The data is displayed on the computer monitor and can be printed or plotted on a hardcopy peripheral. • Graphical analysis capabilities include markers, line slope, zooming, and smoothing. • A library of tests is included for resistors, capacitors, diodes, bipolar transistors, and FETS. Test setup and sample data files are included on disk. • A test sequencing procedure lets you chain multiple tests without operator interventions. • Full Model 213 support provides an easy method of interfacing a four-channel voltage bias source. • Model 707 support for uploading and downloading of up to 100 setups expands the capability to run multiple tests on multiple devices. • The Model 2361 Trigger Controller that is available simplifies trigger connections and optimizes trigger response times among the source measure units.